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EMC – Life and Time Management & Statistical Process Control (SPC) for an EMC Laboratory

May 31, 2017 @ 6:00 pm - 9:00 pm

Presentations by Kimball Williams, Past President IEEE EMC Society

Portrait of Kimball Williams

Life and Time Management

A short presentation looking back on 75 years of life, and some suggestions on how to use time and planning to achieve the goals you select and work toward.

Statistical Process Control (SPC) for an EMC Laboratory

Measurement system variability in a test laboratory can be a source of discomfort for the test engineer, the designer and management. This is especially true in product development laboratories where the question of exactly what effect a design change had on system behavior is of central interest. The use of Statistical Process Control (SPC) methods to gage and track the variability of system measurements can provide confidence in the repeatability of the system setup, and in the data it produces.

However, the use of SPC in an EMC Lab, especially for frequency domain measurements, requires decisions to limit the quantity of the data to avoid information overload. To accomplish this careful selection of the measurement methods is essential.

RSVP jblack@dlsemc.com or 1-847-537-6400

  • Dinner and Refreshments 6:00 to 6:30
  • Chapter Updates 6:30 to 6:45
  • Introduction 6:45 to 7:00
  • Presentation 7:00 to 9:00

Note: By confirming your attendance or by attending the IEEE chapter event you signify that you will abide by all federal, state and local laws, general rules of conduct and etiquette, and are subject to removal in the event these rules and laws are broken.


May 31, 2017
6:00 pm - 9:00 pm
Event Category:


D.L.S. Electronic Systems, Inc.
1250 Peterson Dr
Wheeling, IL 60090 United States
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