IEEE Chicago & IEEE Region 4 Industry Engagement Committee present: “Seeing the Invisible: The Art of Nanoscale Surface Characterization and Instruments at Bruker Nano”
July 14, 2020 @ 10:00 am - 11:10 am CDT
Join us for this IEEE Chicago Section & IEEE Region 4 Industry Engagement Committee hosted webinar and learn more about the nanoscience and nanotechnology, – a rapidly developing field of science that studies extremely small things and encompasses all the other major science fields, such as chemistry, biology, physics, materials science, and engineering. “Nanoscale” refers to objects with dimensions of about one to one hundred nanometers. To put things into perspective: one nanometer is 25,400,000 times smaller than one inch and 100,000 smaller than the diameter of a human hair! This presentation will be an overview of several examples of current technologies and new developments in the field of nanometer-scale characterization techniques from the Bruker Nano Surfaces division at Bruker, the world leader in the field. These include Atomic Force Microscopes (AFM), White Light Interferometers, AFM-Infrared combined Spectrometers, Nanoindenters, and more. This overview webinar will take a look at the operating principles of each of these instrument types and show examples of their common usage in R&D.
AFMs have been used for years for metrology and visualization of surface microstructure, and there were improvements in this area with the invention of PeakForce Tapping mode 10 years ago. This development, however, resulted in the creation of many new measurement techniques for the study of mechanical, electrical, and electrochemical properties at the nanometer scale. Improvements in scan speed, from minutes to seconds, has also improved throughput and enabled dynamic studies. Correlative microscopy with inverted optical microscopy allows the use of optical techniques, such as fluorescence or confocal-based, to be combined in life science and materials studies. AFM-based infrared spectroscopy (AFM-IR) uses an AFM probe to locally detect sample thermal expansion from absorption of infrared radiation, providing IR spectroscopy and chemical analysis imaging capabilities with the high spatial resolution. These AFM technologies will be described along with some recent advances.
Profilometry, both optical and stylus, enables nanometer to angstrom level vertical resolution on surfaces, while providing a wider overall field of view in the lateral plane than AFM. Bruker’s 3D optical microscopes – based on white light interferometry (WLI) – make it possible to study nano-scale surface metrology to investigate nano/micro-scale functional behavior for various applications in semiconductors, micro-electronics, optics, biomedical devices and precision machining. Stylus profilers enable fast and accurate contact-probe measurements of height variation on a surface, with sub-nm precision in height.
Nanoindentation techniques have been a method of choice to characterize the deformation mechanisms of materials at nano/micro-scale, where the mechanical properties often differ from their bulk counterparts. The techniques, which can be performed in a stand-alone unit or inside a SEM and TEM, will be briefly discussed.
Online Event, IL